services
- Electrostatic Discharge Testing
- Latch-up Testing
- Gate Oxide Leakage Testing



Our Services
Electrostatic Discharge Testing
| Human Body Model |
Model Machine Model |
Charged Device Model |
- EIA/JEDEC JESD22-A114
- ESD-STM5.1 2001
- MIL-STD-883G, Method 3015.7
- AEC-Q100-002
- MIL-STD-750E
- METHOD 1020.2
|
- EIA/JEDEC JESD22-A115
- ESD-STM5.2 1999
- AEC-Q100-003
|
- EIA/JEDEC JESD22-C101
- ESD-STM5.3.1 1999
- AEC-Q100-011
|
- Design validation both on device and system levels
- Up to 2016-pin testing capability
- HBM testing range from 25V to 8KV
- MM testing from 25V to 2KV
- Power supply sequencing
- Characterization
- Testing performed to JEDEC, Mil Std, IEC, AEC and ESDA
Latch-up Testing
- Latch-up testing with 256K vectors/ pin with Read Back
- Characterization
- Testing performed to JEDEC, Mil Std, IEC, AEC and ESDA
- EIA/JEDEC JESD78
- AEC-Q100-004
Gate Oxide Leakage Testing
- Electro-thermally induced parasitic gate leakage testing
- Test performed to AEC Q100-006
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STS, Inc. All Rights Reserved.